Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
|Publication Date:||10 January 1997|
|ICS Code (Measurement of electrical and magnetic quantities):||17.220.20|
This test method describes equipment and techniques for detecting contact resistance transients yielding resistances greater than a specified value and lasting for at least a specified minimum duration.
The minimum durations specified in this standard are 1, 10, and 50 nanoseconds (ns).
The minimum sample resistance required for an event detection in this standard is 10 Ω.
An ASTM guide for measuring electrical contact transients of various durations is available as Guide B 854.
This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.