UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

ASTM F24

Standard Method for Measuring and Counting Particulate Contamination on Surfaces

inactive
Buy Now
Organization: ASTM
Publication Date: 10 May 2000
Status: inactive
Page Count: 3
ICS Code (Properties of surfaces): 17.040.20
scope:

This method covers the size distribution analysis of particulate contamination, 5 µm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (±33 % of the average of two runs) should be expected for replicate counts on the same sample.

NOTE 1 - For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield.

Document History

April 1, 2020
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
April 1, 2009
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
April 1, 2009
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
September 1, 2004
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
This test method covers the size distribution analysis of particulate contamination, 5 µm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
ASTM F24
May 10, 2000
Standard Method for Measuring and Counting Particulate Contamination on Surfaces
This method covers the size distribution analysis of particulate contamination, 5 µm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum...
August 31, 1965
STANDARD METHOD FOR MEASURING AND COUNTING PARTICULATE CONTAMINATION ON SURFACES (R 1983)
A description is not available for this item.
Advertisement