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IEC/PAS 62163

External Visual Test Method

inactive
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Organization: IEC
Publication Date: 1 August 2000
Status: inactive
Page Count: 5

Document History

IEC/PAS 62163
August 1, 2000
External Visual Test Method
A description is not available for this item.

References

This document is replaced by:
IEC 60749-3 - Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination
Published by IEC on March 1, 2017
The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement...
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