DIN EN 60444-2
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
active, Most Current
| Organization: | DIN |
| Publication Date: | 1 October 1997 |
| Status: | active |
| Page Count: | 9 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
DIN EN 60444-2
October 1, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
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