ECIA - EIA-364-87
TP-87 Nanosecond-Event Detection for Electrical Connectors, Contacts and Sockets
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| Organization: | ECIA |
| Publication Date: | 1 January 1997 |
| Status: | inactive |
| Page Count: | 19 |
Document History
April 1, 2017
TP-87B Nanosecond Event Detection Test Procedure for Electrical Connectors, Contacts and Sockets
Content
The object of this procedure is to define methods for detecting events that can be as short as 1 nanosecond
Description
The methods as described herein are for detection of specimen...
May 1, 2009
TP-87A NANOSECOND EVENT DETECTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS
Content
The object of this procedure is to define methods for detecting events that can be as short as 1 nanosecond, see table 1.
Description
The methods as described herein are for detection of...
EIA-364-87
January 1, 1997
TP-87 Nanosecond-Event Detection for Electrical Connectors, Contacts and Sockets
A description is not available for this item.