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NPFC - MIL-PRF-39016/18

RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN

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Organization: NPFC
Publication Date: 6 October 2003
Status: inactive
Page Count: 2

Document History

MIL-PRF-39016/18J
October 26, 2022
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-PRF-39016/18
March 31, 2016
Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 1.0 Ampere with Internal Diode for Coil Transient Suppression, Terminals 0.100-Inch Grid Pattern
A description is not available for this item.
MIL-PRF-39016/18
March 30, 2010
Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 1.0 Ampere with Internal Diode for Coil Transient Suppression, Terminals 0.100-Inch Grid Pattern
A description is not available for this item.
MIL-PRF-39016/18
April 1, 2005
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-PRF-39016/18
October 6, 2003
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-PRF-39016/18
September 7, 1998
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
June 23, 1993
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
January 21, 1992
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
November 20, 1991
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
September 9, 1991
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
April 24, 1990
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
July 17, 1989
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-PRF-39016/18
July 20, 1988
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the relays described herein shall consist of this specification...
MIL-R-39016/18
November 25, 1985
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
September 13, 1984
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
February 10, 1984
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
August 30, 1983
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
March 26, 1982
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18D (1)
August 31, 1981
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
November 14, 1980
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
March 5, 1980
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18B
October 25, 1977
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-39016/18
June 1, 1973
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
MIL-R-0039016/18
April 16, 1971
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS 0.100-INCH GRID PATTERN
A description is not available for this item.
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References

This document references:
MIL-PRF-39016/19 - Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 1 Ampere with Internal Diode for Coil Transient Suppression and Polarity Reversal Protection, Terminals 0.100- Inch Grid Pattern
Published by NPFC on January 31, 2011
A description is not available for this item.
This document references:
MIL-PRF-39016/43 - Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 1.0 Ampere, with Internal Diodes for Coil Transient Suppression, and Polarity Reversal Protection Terminals 0.100- Inch Grid Pattern (Sensitive, 60 Milliwatts, Coil Operate Power at 25 Degrees C)
Published by NPFC on March 30, 2010
A description is not available for this item.
This document references:
MIL-I-631 - Insulation, Electrical, Synthetic - Resin Composition, Nonrigid
Published by NPFC on February 26, 2021
A description is not available for this item.
This document references:
MIL-PRF-39016/42F (1) - RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE WITH INTERNAL DIODE FOR COIL TRANSIENT SUPPRESSION, TERMINALS .100-INCH GRID PATTERN (SENSITIVE 60 MILLIWATTS, COIL OPERATE POWER AT 25°C)
Published by DLA on October 13, 2023
A description is not available for this item.
This document references:
MIL-PRF-39016 - RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Published by NPFC on September 13, 2017
A description is not available for this item.
This document references:
MIL-STD-1285 - MARKING OF ELECTRICAL AND ELECTRONIC PARTS
Published by NPFC on July 8, 2019
Scope. This standard establishes requirements for the physical marking of electrical and electronic parts. This standard should be implemented by incorporating suitable requirements directly in...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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