JEDEC JESD 22-B108
Coplanarity Test for Surface-Mount Semiconductor Devices
inactive
Buy Now
| Organization: | JEDEC |
| Publication Date: | 1 January 2003 |
| Status: | inactive |
| Page Count: | 13 |
scope:
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.
Document History
September 1, 2010
Coplanarity Test for Surface-Mount Semiconductor Devices
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity at room temperature for surface-mount semiconductor devices. This test method is...
JEDEC JESD 22-B108
January 1, 2003
Coplanarity Test for Surface-Mount Semiconductor Devices
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.
January 1, 1991
Coplanarity Test for Surface-Mount Semiconductor Devices
A description is not available for this item.
Related Products
Searching for related products...