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JEDEC JEP 149

Application Thermal Derating Methodologies

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Organization: JEDEC
Publication Date: 1 November 2004
Status: inactive
Page Count: 18
scope:

This publication applies to the application of integrated circuits and their associated packages in end use designs. It summarizes the methodology of thermal derating and the suitability of such methodologies. 

Document History

January 1, 2021
Application Thermal Derating Methodologies
This publication applies to the application of integrated circuits and their associated packages in end use designs. It summarizes the methodology of thermal derating and the suitability of such...
JEDEC JEP 149
November 1, 2004
Application Thermal Derating Methodologies
This publication applies to the application of integrated circuits and their associated packages in end use designs. It summarizes the methodology of thermal derating and the suitability of such...

References

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