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ASTM F772

Standard Test Method for Noise Quality of Film-Type Resistors

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Organization: ASTM
Publication Date: 25 June 1982
Status: inactive
Page Count: 3
scope:

1. Scope

1.1 This method describes a procedure for measuring the current noise developed in a resistor under d-c voltage by observing the fluctuation voltage developed across the resistor.

Document History

ASTM F772
June 25, 1982
Standard Test Method for Noise Quality of Film-Type Resistors
1. Scope 1.1 This method describes a procedure for measuring the current noise developed in a resistor under d-c voltage by observing the fluctuation voltage developed across the resistor.
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