DS/IEC 512-1
Electromechanical components for electronic equipment; b asic testing procedures and measuring methods - Part 1: Gene ral
inactive
| Organization: | DS |
| Publication Date: | 14 April 1988 |
| Status: | inactive |
scope:
The standard contains basic test methods and procedures appl icable to electromechanical components, with the following f amilies or sub-families: Connection (solderless), connectors for freguencies below 3 MHz, sockets for electronic tubes, sockets for other plug-in devices, switches (lever, push-but ton, rotary, sensitive, thermal time delay, thermostatic).
Document History
October 31, 1989
Electromechanical components for electronic equipment; basic testing procedures and measuring methods – Part 1: General
The standard contains basic test methods and procedures applicab le to electromechanical components, with the following families or sub-families: Connection (solderless), connectors for frequen cies...
DS/IEC 512-1
April 14, 1988
Electromechanical components for electronic equipment; b asic testing procedures and measuring methods - Part 1: Gene ral
The standard contains basic test methods and procedures appl icable to electromechanical components, with the following f amilies or sub-families: Connection (solderless), connectors for freguencies...
Related Products
Searching for related products...