UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Webinars & White Papers

ASTM E1161

Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components

inactive
Buy Now
Organization: ASTM
Publication Date: 10 December 1995
Status: inactive
Page Count: 3
ICS Code (Semiconductor devices in general): 31.080.01
scope:

1. Scope

1.1 This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items. This test method covers the radiographic testing of these items for possible defective conditions such as extraneous material within the sealed case, improper internal connections, voids in materials used for element mounting, or the sealing glass, or physical damage.

1.2 The quality level and acceptance criteria for the specimens being tested shall be specified in the detail drawing, purchase order or contract.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

June 1, 2009
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical...
June 1, 2009
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
This practice provides the minimum requirements for nondestructive radiologic examination of semiconductor devices, microelectronic devices, electromagnetic devices, electronic and electrical...
June 10, 2003
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items....
ASTM E1161
December 10, 1995
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
1. Scope 1.1 This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of...
September 15, 1992
STANDARD TEST METHOD FOR RADIOLOGIC TESTING OF SEMICONDUCTORS AND ELECTRONIC COMPONENTS
A description is not available for this item.
March 27, 1987
STANDARD TEST METHOD FOR RADIOGRAPHIC TESTING OF SEMICONDUCTORS AND ELECTRONIC COMPONENTS
A description is not available for this item.

References

Advertisement