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BSI - BS CECC 90112

MOS Read/Write Dynamic Memories Silicon Monolithic Circuits

inactive
Organization: BSI
Publication Date: 15 August 1987
Status: inactive
Page Count: 28
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS CECC 90112
August 15, 1987
Blank Detail Specification: MOS Read/Write Dynamic Memories Silicon Monolithic Circuits
A description is not available for this item.
BS CECC 90112
August 15, 1987
MOS Read/Write Dynamic Memories Silicon Monolithic Circuits
A description is not available for this item.

References

This document references:
BS CECC 90000 - Harmonized System of Quality Assessment for Electronic Components - Generic Specification: Monolithic Integrated Circuits
Published by BSI on November 29, 1985
General details, quality assessment procedures, test and measurement procedures and details of screening requirements.
This document references:
BS CECC 90100 - Harmonized System of Quality Assessment for Electronic Components: Sectional Specification: Digital Monolithic Integrated Circuits
Published by BSI on August 31, 1983
A description is not available for this item.
This document references:
BS 3939-12 - Graphical Symbols for Electrical Power, Telecommunications and Electronics Diagrams Part 12: Guide for Binary Logic Elements
Published by BSI on August 30, 1991
A description is not available for this item.
This document references:
BS 9000-2 - General Requirements for a System for Electronic Components of Assessed Quality Part 2: Specification for the National Implementation of the CECC System
Published by BSI on May 15, 1996
A description is not available for this item.
This document references:
BS 9000-3 - General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System
Published by BSI on May 15, 1996
A description is not available for this item.
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