IEC 60749-33
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
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| Organization: | IEC |
| Publication Date: | 1 March 2004 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices): | 31.080 |
scope:
Scope and object
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of nonhermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors passing through it. This test is used to identify failure mechanisms internal to the package and is destructive.
Document History
IEC 60749-33
March 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Scope and object
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of nonhermetic packaged solid-state devices using moisture condensing or moisture saturated...