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IEC 60748-4-3

Semiconductor devices – Integrated circuits – Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)

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Organization: IEC
Publication Date: 1 August 2006
Status: active
Page Count: 42
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.

 

Document History

IEC 60748-4-3
August 1, 2006
Semiconductor devices – Integrated circuits – Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)
This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.  

References

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