IEC 60748-4-3
Semiconductor devices – Integrated circuits – Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)
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| Organization: | IEC |
| Publication Date: | 1 August 2006 |
| Status: | active |
| Page Count: | 42 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
Document History
IEC 60748-4-3
August 1, 2006
Semiconductor devices – Integrated circuits – Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)
This part of IEC 60748 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.