ECIA - EIA-448-4
Standard Test Methods for Electromechanical Switches (Test Methods for Logic (TTL) Level Endurance and Low Level Endurance)
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| Organization: | ECIA |
| Publication Date: | 1 November 1980 |
| Status: | active |
| Page Count: | 8 |
scope:
PURPOSE
The Logic Level Endurance Test is a measure of the ability of a switch to control electrical loads in which the applied voltage exceeds the melting voltage of the switch contact material and is less than the arcing voltage and arcing current. Electronic logic circuits have defined interface signal voltages. Logic "0" is a signal voltage between 0 and 0.9 volts. Logic "1" is a signal voltage greater than 2.4 volts and less than 5.5 volts.
Document History
March 1, 1993
Method 15 Standard Test Method for Electromechanical Switches (Test for Contact Bounce)
PURPOSE
The purpose of this test method is to determine the duration of contact bounce so that it can be anticipated and provided for in user circuits. This phenomenon is defined as the random...
EIA-448-4
November 1, 1980
Standard Test Methods for Electromechanical Switches (Test Methods for Logic (TTL) Level Endurance and Low Level Endurance)
PURPOSE
The Logic Level Endurance Test is a measure of the ability of a switch to control electrical loads in which the applied voltage exceeds the melting voltage of the switch contact material and...
March 1, 1980
Test Standard for Electromechanical Components Environmental Effects of Machine Soldering
PURPOSE
The purpose of this standard is to evaluate electromechanical components which have been subjected to the environmental effects of machine soldering and the associated fluxing, preheating,...
March 1, 1978
Standard Test Methods for Electromechanical Switches
This standard establishes uniform test methods for those tests which are peculiar to electromechanical switches, except those classified as industrial controls (as defined in ANSI C19.3). In case of...