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NPFC - MIL-R-39016/12

RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)

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Organization: NPFC
Publication Date: 21 September 1992
Status: inactive
Page Count: 2

Document History

MIL-PRF-39016/12H VALID NOTICE 1
August 17, 2021
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-PRF-39016/12
November 14, 2016
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-PRF-39016/12
September 13, 2012
Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 1.0 Ampere (Latching)
A description is not available for this item.
MIL-PRF-39016/12G (1)
February 28, 2006
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-PRF-39016/12G
December 3, 2004
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-PRF-39016/12
August 14, 1998
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
September 21, 1992
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
September 9, 1991
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
July 20, 1988
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the relays described herein shall consist of this specification...
MIL-R-39016/12
September 30, 1986
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
August 2, 1985
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
March 18, 1985
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
February 10, 1984
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12D (1)
March 22, 1983
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
September 27, 1982
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12C (1)
August 31, 1981
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
November 14, 1980
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
October 25, 1977
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
December 1, 1975
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
November 3, 1973
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
June 29, 1973
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
MIL-R-39016/12
October 30, 1970
RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING)
A description is not available for this item.
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References

This document references:
MIL-PRF-39016/30 - Relays, Electromagnetic, Established Reliability, DPDT, Low Level to 1.0 Ampere (Latching) with Internal Diodes for Coil Transient Suppression and Polarity Reversal Protection
Published by NPFC on March 31, 2015
A description is not available for this item.
This document references:
A-A-55485/5 - MOUNTING PADS, ELECTRICAL-ELECTRONIC COMPONENT, LEAD CONVERSION, .200 or .230 DIAMETER PIN CENTER TO A GRID PATTERN
Published by NPFC on August 14, 2020
A description is not available for this item.
This document references:
A-A-55485 - MOUNTING PADS, ELECTRICAL-ELECTRONIC COMPONENT, GENERAL REQUIREMENTS FOR
Published by NPFC on April 11, 2011
This CID covers the general requirements for electrical-electronic component mounting pads. Requirements for specific mounting pads are covered in the individual CID sheets. Mounting pads covered by...
This document references:
MIL-PRF-39016/29J - RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, DPDT, LOW LEVEL TO 1.0 AMPERE (LATCHING) WITH INTERNAL DIODES FOR COIL TRANSIENT SUPPRESSION
Published by DLA on February 22, 2023
A description is not available for this item.
This document references:
MIL-PRF-39016 - RELAYS, ELECTROMAGNETIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Published by NPFC on September 13, 2017
A description is not available for this item.
This document references:
MIL-STD-1285 - MARKING OF ELECTRICAL AND ELECTRONIC PARTS
Published by NPFC on July 8, 2019
Scope. This standard establishes requirements for the physical marking of electrical and electronic parts. This standard should be implemented by incorporating suitable requirements directly in...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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