ASTM F769
STANDARD TEST METHOD FOR MEASURING TRANSISTOR AND DIODE LEAKAGE CURRENTS
inactive
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| Organization: | ASTM |
| Publication Date: | 15 October 1991 |
| Status: | inactive |
| Page Count: | 3 |
| ICS Code (Transistors): | 31.080.30 |
| ICS Code (Diodes): | 31.080.10 |
Document History
June 10, 2000
Standard Test Method for Measuring Transistor and Diode Leakage Currents
1. Scope 1.1 This test method covers the measurement of leakage currents of transistors and diodes. Electronic devices exposed to ionizing radiation may show increases in leakage current as the...
ASTM F769
October 15, 1991
STANDARD TEST METHOD FOR MEASURING TRANSISTOR AND DIODE LEAKAGE CURRENTS
A description is not available for this item.
May 29, 1987
STANDARD TEST METHOD FOR MEASURING TRANSISTOR AND DIODE LEAKAGE CURRENTS
A description is not available for this item.
May 25, 1984
STANDARD METHOD FOR MEASURING TRANSISTOR AND DIODE LEAKAGE CURRENTS
A description is not available for this item.