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IEC 60596

Definitions of Test Method Terms for Semiconductor Radiation Detectors and Scintillation Counting

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Organization: IEC
Publication Date: 1 January 1978
Status: inactive
Page Count: 24

Document History

IEC 60596
January 1, 1978
Definitions of Test Method Terms for Semiconductor Radiation Detectors and Scintillation Counting
A description is not available for this item.
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