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DLA - SMD-5962-91545 REV C

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 19 May 1995
Status: inactive
Page Count: 24
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Standby Supply Device type Generic number Circuit function Access time Current 01 V2500H 38-input, 24-output and-or-logic array 35 ns 02 V2500H 38-input, 24-output and-or-logic array 25 ns 03 V2500L 38-input, 24-output and-or-logic array 35 ns 10 mA 04 V2500B 38-input, 24-output and-or-logic array 15 ns 05 V2500BL 38-input, 24-output and-or-logic array 20 ns 10 mA 06 V2500BQ 38-input, 24-output and-or-logic array 25 ns 07 V2500BQL 38-input, 24-output and-or-logic array 30 ns 5 mA

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline Letter Descriptive designator Terminals Package style Q GDIP1-T40 or CDIP2-T40 40 Dual-in-line1/ X CQCC1-N44 44 Square leadless chip carrier1/ Y See figure 1 44 J-leaded chip carrier1/

The Lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Input voltage range- - - - - - - - - - - - - - - - −2.0 V dc to +7.0 V dc 4/ Output voltage range applied - - - - - - - - - - - −0.5 V dc to +7.0 V dc 4/ Output sink current- - - - - - - - - - - - - - - - 8 mA Thermal resistance, junction-to-case (θJC): Cases Q, X - - - - - - - - - - - - - - - - - - - See MIL-STD-1835 Case Y - - - - - - - - - - - - - - - - - - - - - 20°C/W Maximum power dissipation (PD) 5/ - - - - - - - - 1.2 W Maximum junction temperature - - - - - - - - - - - +175°C Lead temperature (soldering, 10 seconds maximum) - +300°C Endurance - - - - - - - - - - - - - - - - - - - - 25 erase/write cycles (minimum)

Supply voltage range (VCC) - - - - - - - - - - - 4.5 V dc minimum to 5.5 V dc maximum Supply voltage (VSS) - - - - - - - - - - - - - - 0.0 V dc High level input voltage range (VIH) - - - - - - 2.0 V dc minimum Low level input voltage range (VIL - - - - - - - 0.8 V dc maximum Case operating temperature range (TC) - - - - - - −55°C to +125°C

Fault coverage measurement of manufacturing Logic tests (MIL-STD-883, test method 5012) - - 6/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

March 1, 2017
MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE, PROGRAMMABLE LOGIC ARRAY MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
August 8, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE, PROGRAMMABLE LOGIC ARRAY MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
August 3, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V). A choice of case outlines and lead finishes are...
April 2, 2002
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
A description is not available for this item.
March 13, 1996
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-91545 REV C
May 19, 1995
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
June 3, 1993
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
October 29, 1992
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
A description is not available for this item.
July 25, 1991
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
A description is not available for this item.
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