UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

NPFC - MIL-HDBK-175

MICROELECTRONIC DEVICE DATA HANDBOOK

active, Most Current
Buy Now
Organization: NPFC
Publication Date: 1 May 1968
Status: active
Page Count: 300

Document History

MIL-HDBK-175
August 23, 2019
Microelectronic Device Data Handbook
A description is not available for this item.
MIL-HDBK-175
August 26, 2014
Microelectronic Device Data Handbook
A description is not available for this item.
MIL-HDBK-175
October 24, 2000
MICROELECTRONIC DEVICE DATA HANDBOOK
A description is not available for this item.
MIL-HDBK-175
May 1, 1968
MICROELECTRONIC DEVICE DATA HANDBOOK
A description is not available for this item.

References

This document references:
MIL-HDBK-108 - QUALITY CONTROL AND RELIABILITY- SAMPLING PROCEDURES AND TABLES FOR LIFE AND RELIABILITY TESTING (BASED ON EXPONENTIAL DISTRIBUTION)
Published by NPFC on April 29, 1960
A description is not available for this item.
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
View Less
View All
Advertisement