DS/ES 59001#
Approval scheme for automotive oriented applications within the electronic components industry – Semiconductor stress test qualification
inactive, Most Current
| Organization: | DS |
| Publication Date: | 1 April 1998 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This specification defines the minimum stress test driven qualification requirements and references test conditions for qualification of semiconductor devices (SCs) for the automotive environment. This document does not relieve the SC supplier of their responsibility to meet their own company´s internal qualification program. In this document, "user" is defined as all automotive companies developing electronic systems and using SCs.
Document History
DS/ES 59001#
April 1, 1998
Approval scheme for automotive oriented applications within the electronic components industry – Semiconductor stress test qualification
This specification defines the minimum stress test driven qualification requirements and references test conditions for qualification of semiconductor devices (SCs) for the automotive environment....
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