UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

IEC/PAS 62161

Steady State Temperature Humidity Bias Life Test

inactive
Buy Now
Organization: IEC
Publication Date: 1 August 2000
Status: inactive
Page Count: 14

Document History

IEC/PAS 62161
August 1, 2000
Steady State Temperature Humidity Bias Life Test
A description is not available for this item.

References

This document is replaced by:
IEC 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Published by IEC on April 1, 2017
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
Advertisement