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IEC/PAS 62161

Steady State Temperature Humidity Bias Life Test

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Organization: IEC
Publication Date: 1 August 2000
Status: inactive
Page Count: 14

Document History

IEC/PAS 62161
August 1, 2000
Steady State Temperature Humidity Bias Life Test
A description is not available for this item.

References

This document is replaced by:
IEC 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Published by IEC on April 1, 2017
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
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