BSI - BS PD ES 59008-4-1
Data requirements for semiconductor die - Part 4-1: Specific requirements and recommendations - Test and quality
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| Organization: | BSI |
| Publication Date: | 15 March 2001 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice. To be read in conjunction with PD ES 59008-1:2000,PD ES 59008-3:1999
Document History
BS PD ES 59008-4-1
March 15, 2001
Data requirements for semiconductor die - Part 4-1: Specific requirements and recommendations - Test and quality
Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice. To be read in conjunction...
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