DS/EN 60749-1
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
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| Organization: | DS |
| Publication Date: | 7 November 2003 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60479 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all other parts of the series. In case of contradiction between this standard and a relevant procurement specification, the latter should govern.
Document History
DS/EN 60749-1
November 7, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
This part of IEC 60479 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all other parts of the series. In case of contradiction...
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