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NPFC - MIL-S-19500/517

SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV

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Organization: NPFC
Publication Date: 24 February 1989
Status: inactive
Page Count: 1

Document History

MIL-S-19500/517
February 24, 1989
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
MIL-S-19500/517
April 11, 1985
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
MIL-S-19500/517
February 6, 1984
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
MIL-S-19500/517
August 17, 1982
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
MIL-S-19500/517 (2)
April 14, 1980
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
MIL-S-19500/517 (1)
October 9, 1979
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
MIL-S-19500/517
May 31, 1977
SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN JANTX, AND JANTXV
A description is not available for this item.
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References

This document references:
MIL-PRF-19500R - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
Published by DLA on July 24, 2021
Scope. This specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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