DIN EN 60749-36
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
active, Most Current
| Organization: | DIN |
| Publication Date: | 1 December 2003 |
| Status: | active |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-36
December 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state (IEC 60749-36:2003); German version EN 60749-36:2003
A description is not available for this item.
May 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state (IEC 47/1585/CDV:2001); German version prEN 60749-36:2001
A description is not available for this item.