CENELEC - EN 60749-23
Semiconductor devices Mechanical and climatic test methods Part 23: High temperature operating life
inactive
| Organization: | CENELEC |
| Publication Date: | 1 April 2004 |
| Status: | inactive |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
April 1, 2004
Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
EN 60749-23
April 1, 2004
Semiconductor devices Mechanical and climatic test methods Part 23: High temperature operating life
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