CENELEC - EN 60749-2
Semiconductor Devices Mechanical and Climatic Test Methods Part 2: Low Air Pressure
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 August 2002 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
EN 60749-2
August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 2: Low Air Pressure
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