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ASTM E1127

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

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Organization: ASTM
Publication Date: 10 May 2003
Status: inactive
Page Count: 5
ICS Code (Physicochemical methods of analysis): 71.040.50

Document History

October 1, 2008
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
This guide covers procedures used for depth profiling in Auger electron spectroscopy.  Guidelines are given for depth profiling The values stated in SI units are to be regarded as standard. No...
October 1, 2008
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
This guide covers procedures used for depth profiling in Auger electron spectroscopy. The values stated in SI units are to be regarded as standard. No other units of measurement are included in this...
ASTM E1127
May 10, 2003
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
A description is not available for this item.
January 25, 1991
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
1. Scope 1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy. 1.2 Guidelines are given for depth profiling by the following: 1.3 This standard does not purport to...
August 29, 1986
STANDARD GUIDE FOR DEPTH PROFILING IN AUGER ELECTRON SPECTROSCOPY
A description is not available for this item.

References

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