DS/ES 59008-4-1
Data requirements for semiconductor die - Part 4-1: Specific requirements and recommendations - Test and quality
active, Most Current
| Organization: | DS |
| Publication Date: | 14 May 2001 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This series of European Specifications specifies requirements for the exchange of data pertaining to bare semiconductor die, with or without connection structures, and minimally packaged semiconductor die. This Specification also gives recommendations for general industry good practice in the use of bare die, with or without connection structures, and minimally packaged die. ES 59008-4-1 specifies the requirements for the data needed to describe the test and quality parameters of the die.
Document History
DS/ES 59008-4-1
May 14, 2001
Data requirements for semiconductor die - Part 4-1: Specific requirements and recommendations - Test and quality
This series of European Specifications specifies requirements for the exchange of data pertaining to bare semiconductor die, with or without connection structures, and minimally packaged...
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