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IEC 60747-5

Semiconductor Devices Discrete Devices and Integrated Circuits Part 5: Optoelectronic Devices

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Organization: IEC
Publication Date: 1 January 1992
Status: inactive
Page Count: 364

Document History

IEC 60747-5
January 1, 1992
Semiconductor Devices Discrete Devices and Integrated Circuits Part 5: Optoelectronic Devices
A description is not available for this item.

References

This document is referenced by:
BS EN 60749-23 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Published by BSI on June 24, 2004
A description is not available for this item.
This document is referenced by:
CEI EN 60749-34 - Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
Published by CEI on February 1, 2012
Scope and object This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
This document is referenced by:
BS EN 61360-4 - Standard data element types with associated classification scheme for electric components Part 4: IEC reference collection of standard data element types and component classes
Published by BSI on December 2, 2005
A description is not available for this item.
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