UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DIN EN 60749-12

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002

active, Most Current
Organization: DIN
Publication Date: 1 April 2003
Status: active
Page Count: 7
ICS Code (Semiconductor devices in general): 31.080.01

Document History

August 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 47/2386/CDV:2017); German version prEN 60749-12:2017
A description is not available for this item.
DIN EN 60749-12
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002
A description is not available for this item.

References

Advertisement