DIN EN 60749-12
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002
active, Most Current
| Organization: | DIN |
| Publication Date: | 1 April 2003 |
| Status: | active |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
August 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 47/2386/CDV:2017); German version prEN 60749-12:2017
A description is not available for this item.
DIN EN 60749-12
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2002); German version EN 60749-12:2002
A description is not available for this item.