JEDEC - EIA-372
Measurement of Small-Signal VHF-UHF Transistor Admittance Parameters
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| Organization: | JEDEC |
| Publication Date: | 1 May 1970 |
| Status: | inactive |
| Page Count: | 12 |
scope:
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372
Document History
May 1, 1970
The Measurement of Small-Signal VHF-UHF Transistor Admittance Parameters
General
The measuring system must provide a means for applying bias to the transistor under test. The bias system must be such as not to influence the accuracy of the measurements.
The signal...
EIA-372
May 1, 1970
Measurement of Small-Signal VHF-UHF Transistor Admittance Parameters
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors....
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