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MODUK - DEF STAN 59-61: 90/182

Semiconductor Device - Photodiode

active, Most Current
Organization: MODUK
Publication Date: 1 December 1977
Status: active
Page Count: 21

Document History

DEF STAN 59-61: 90/182
December 1, 1977
Semiconductor Device - Photodiode
A description is not available for this item.

References

This document references:
BS 6001-1 - Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
Published by BSI on December 15, 1999
A description is not available for this item.
This document references:
BS 6001-3 - Sampling procedures for inspection by attributes Part 3: Skip-lot sampling procedures
Published by BSI on June 23, 2005
A description is not available for this item.
This document references:
BS 6001-4 - Sampling procedures for inspection by attributes - Part 4: System of sequential sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection
Published by BSI on August 4, 2005
A description is not available for this item.
This document is referenced by:
DEF STAN 59-61: 90/032 - Semiconductor Device Transistor
Published by MODUK on January 1, 1980
A description is not available for this item.
This document is referenced by:
DEF STAN 00-970: PART 0 - Certification Specifications for Airworthiness Part 0: PROCEDURES FOR USE, CONTENT AND DEFINITIONS
Published by MODUK on March 14, 2021
Part 0 provides guidance and content information, together with definitions of terms used throughout this Standard.
This document is referenced by:
DEF STAN 00-970: PART 9 - Design and Airworthiness Requirements for Service Aircraft Part 9: Remotely Piloted Air Systems
Published by MODUK on September 28, 2017
(a) The mandatory requirements set out in this Standard are those basic requirements needed for the design and development of airworthy RPAS for all three UK Armed Services based on the requirements...
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