JEDEC JESD 25
Measurement of Small-Signal Transistor Scattering Parameters
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| Organization: | JEDEC |
| Publication Date: | 1 November 1972 |
| Status: | active |
| Page Count: | 32 |
scope:
This standard provides a test method and definition for small-signal conditions at microwave frequencies.
Document History
JEDEC JESD 25
November 1, 1972
Measurement of Small-Signal Transistor Scattering Parameters
This standard provides a test method and definition for small-signal conditions at microwave frequencies.
January 1, 1972
Measurement of Small-Signal Transistor Scattering Parameters
A description is not available for this item.
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