UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

IEC 61000-4-33

Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters

active, Most Current
Buy Now
Organization: IEC
Publication Date: 1 September 2005
Status: active
Page Count: 76
ICS Code (Immunity): 33.100.20
ICS Code (Emission): 33.100.10
scope:

This part of IEC 61000 provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from highpower transient electromagnetic parameters. These responses can include:

- the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident plus scattered fields within a system under test);

- the current I (e.g., induced by a transient field or within a system under test);

- the voltage V (e.g., induced by a transient field or within a system under test);

- the charge Q induced on a cable or other conductor. NOTE The charge Q on the conductor is a fundamental quantity that can be defined at any frequency. The voltage V, however, is a defined (e.g., secondary) quantity, which is valid only at low frequencies. At high frequencies, the voltage cannot be defined as the line integral of the Efield, since this integral is pathdependent. Thus, for very fast rising pulses (having a large highfrequency spectral content) the use of the voltage as a measurement observable is not valid. In this case, the charge is the desired quantity to be measured.

These measured quantities are generally complicated timedependent waveforms, which can be described approximately by several scalar parameters, or "observables". These parameters include:

- the peak amplitude of the response,

- the waveform risetime,

- the waveform falltime (or duration),

- the pulse width, and

- mathematically defined norms obtained from the waveform.

This International Standard provides information on the measurement of these waveforms and on the mathematical determination of the characterizing parameters. It does not provide information on specific level requirements for testing.

Document History

IEC 61000-4-33
September 1, 2005
Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters
This part of IEC 61000 provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from highpower transient electromagnetic parameters. These...

References

Advertisement