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BSI - BS EN 120003

Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays

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Organization: BSI
Publication Date: 15 November 1986
Status: active
Page Count: 18
ICS Code (Transistors): 31.080.30

Document History

BS EN 120003
November 15, 1986
Specification for Harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
A description is not available for this item.

References

This document references:
BS 9000-2 - General Requirements for a System for Electronic Components of Assessed Quality Part 2: Specification for the National Implementation of the CECC System
Published by BSI on May 15, 1996
A description is not available for this item.
This document references:
BS CECC 20000 - Harmonized system of quality assessment for electronic components: Generic specification: Semiconductor optoelectronic and liquid crystal devices
Published by BSI on June 30, 1983
Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.

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