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JEDEC JESD 22-A109

Hermeticity

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Organization: JEDEC
Publication Date: 1 July 2001
Status: inactive
Page Count: 17
scope:

This revised test method establishes a standard procedure for determining the effectiveness of the seal of hermetically sealed solid state devices. The objective of this revision was to modify the test parameters to reflect current practice and to eliminate the specification of fluorocarbons, banned from use due to environmental concerns.

Document History

JEDEC JESD 22-A109
November 1, 2011
Hermeticity
A description is not available for this item.
JEDEC JESD 22-A109
July 1, 2001
Hermeticity
This revised test method establishes a standard procedure for determining the effectiveness of the seal of hermetically sealed solid state devices. The objective of this revision was to modify the...
JESD22-A109
January 1, 1988
Test Method A109 Hermeticity
A description is not available for this item.

References

This document is referenced by:
JESD22-B105E - Lead Integrity
Published by JEDEC on February 1, 2018
This test method provides various test conditions for determining the integrity of the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly processing...
This document is referenced by:
IEC TS 62686-1 - Process management for avionics – Electronic components for aerospace, defence and high performance (ADHP) applications – Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by IEC on April 1, 2020
This part of IEC 62686, which is a Technical Specification, defines the minimum requirements for general purpose "off the shelf" COTS (commercial off-the-shelf) integrated circuits and discrete...
This document is referenced by:
JEDEC JESD 88 - JEDEC Dictionary of Terms for Solid State Technology
Published by JEDEC on July 1, 2007
Each term and definition in this dictionary has been included strictly for application within the solid-state industry. Many of the terms and definitions in this dictionary may have applicability...
This document is referenced by:
BS PD IEC TS 62686-1 - Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by BSI on April 30, 2020
A description is not available for this item.
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