DS/IEC 747-12
Semiconductor devices - Part 12: Sectional specification for optoelectronic devices
inactive, Most Current
| Organization: | DS |
| Publication Date: | 5 March 1993 |
| Status: | inactive |
| ICS Code (Optoelectronics. Laser equipment): | 31.260 |
scope:
This publication also bears the number QC 720100, which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). Gives details of the quality assessment procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for semiconductor optoelectronic devices. Applies to: - Semiconductor photoemitters, - Semiconductor photosensitive devices, - Semiconductor imaging devices, - Photocouplers.
Document History
DS/IEC 747-12
March 5, 1993
Semiconductor devices - Part 12: Sectional specification for optoelectronic devices
This publication also bears the number QC 720100, which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). Gives details of the quality assessment...
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