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ASTM F466

Standard Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0-GHz Frequency Range

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Organization: ASTM
Publication Date: 30 March 1979
Status: inactive
Page Count: 8

Document History

ASTM F466
March 30, 1979
Standard Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0-GHz Frequency Range
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