AFNOR - NF EN 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
inactive
| Organization: | AFNOR |
| Publication Date: | 1 December 2006 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
September 20, 2014
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
A description is not available for this item.
NF EN 60749-26
December 1, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 26 : electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
A description is not available for this item.
Related Products
Searching for related products...