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IEC/PAS 62162

Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of Microelectronic Components

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Organization: IEC
Publication Date: 1 August 2000
Status: active
Page Count: 14
ICS Code (Semiconductor devices in general): 31.080.01

Document History

IEC/PAS 62162
August 1, 2000
Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of Microelectronic Components
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