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IEC/PAS 62336

Accelerated Moisture Resistance - Unbaised HAST

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Organization: IEC
Publication Date: 1 August 2002
Status: inactive
Page Count: 14
ICS Code (Semiconductor devices in general): 31.080.01

Document History

IEC/PAS 62336
August 1, 2002
Accelerated Moisture Resistance - Unbaised HAST
A description is not available for this item.

References

This document is replaced by:
IEC 60749-24 - Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Published by IEC on March 1, 2004
Scope and object The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid...
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