DIN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 47/2193/CD:2014)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 August 2014 |
| Status: | inactive |
| Page Count: | 33 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-44
August 1, 2014
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 47/2193/CD:2014)
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