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BSI - BS PD IEC/TS 61967-3

Integrated circuits — Measurement of electromagnetic emissions Part 3: Measurement of radiated emissions — Surface scan method

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Organization: BSI
Publication Date: 30 September 2014
Status: active
Page Count: 38
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS PD IEC/TS 61967-3
September 30, 2014
Integrated circuits — Measurement of electromagnetic emissions Part 3: Measurement of radiated emissions — Surface scan method
A description is not available for this item.
January 9, 2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method
A description is not available for this item.

References

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