IEC 60749-5
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 5: Steady-State Temperature Humidity Bias Life Test
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Organization: | IEC |
Publication Date: | 1 January 2003 |
Status: | inactive |
Page Count: | 22 |
ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History

April 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...

IEC 60749-5
January 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 5: Steady-State Temperature Humidity Bias Life Test
A description is not available for this item.