UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

JSA - JIS R 1683

Test method for surface roughness of ceramic thin films by atomic force microscopy

active, Most Current
Buy Now
Organization: JSA
Publication Date: 20 October 2014
Status: active
ICS Code (Advanced ceramics): 81.060.30

Document History

JIS R 1683
October 20, 2014
Test method for surface roughness of ceramic thin films by atomic force microscopy
A description is not available for this item.
JIS R 1683
November 20, 2007
Test method for surface roughness of ceramic thin films by atomic force microscopy
A description is not available for this item.

References

This document references:
JIS B 0601 - Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters
Published by JSA on March 21, 2013
A description is not available for this item.
This document references:
JIS B 0633 - Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Rules and Procedures for the Assessment of Surface Texture
Published by JSA on January 20, 2001
A description is not available for this item.
This document references:
JIS B 0651 - Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Nominal Characteristics of Contact (Stylus) Instruments
Published by JSA on January 20, 2001
A description is not available for this item.
This document references:
JIS Z 8401 - Rounding of numbers
Published by JSA on July 22, 2019
A description is not available for this item.
View Less
View All
Advertisement