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ASTM E1078

Standard Guide for Specimen Preparation and Mounting in Surface Analysis

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Organization: ASTM
Publication Date: 1 October 2014
Status: inactive
Page Count: 10
ICS Code (Physicochemical methods of analysis): 71.040.50
scope:

This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

Auger electron spectroscopy (AES),

X-ray photoelectron spectroscopy (XPS and ESCA), and

Secondary ion mass spectrometry (SIMS).

Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

October 1, 2014
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES),...
ASTM E1078
October 1, 2014
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES),...
May 1, 2009
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES),...
August 10, 2002
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: Auger electron spectroscopy (AES),...
September 10, 1997
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
1. Scope 1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines: 1.1.1 Auger electron...
January 1, 1996
Standard Guide for Procedures for Specimen Preparation, Mounting, and Analysis in Auger Electron Spectroscopy, X-Ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry
A description is not available for this item.
August 31, 1990
STANDARD GUIDE FOR SPECIMEN HANDLING IN AUGER ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON SPECTROSCOPY, AND SECONDARY ION MASS SPECTROMETRY
A description is not available for this item.
September 27, 1985
STANDARD GUIDE FOR SPECIMEN HANDLING IN AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY
A description is not available for this item.

References

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