NPFC - MIL-HDBK-814
Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor Devices
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| Organization: | NPFC |
| Publication Date: | 30 January 2015 |
| Status: | active |
| Page Count: | 1 |
Document History
September 3, 2021
Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor Devices
A description is not available for this item.
MIL-HDBK-814
January 30, 2015
Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor Devices
A description is not available for this item.
February 8, 1994
IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
Systems that must operate in a radiation environment have to be designed to be survivable (hard) to radiation stress levels specified for them. In addition to design hardening, a Hardness Assurance...