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IEEE 1620.1

Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

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Organization: IEEE
Publication Date: 8 June 2006
Status: active
Page Count: 26
scope:

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Purpose

The purpose of this standard is to provide a method for systematically characterizing organic transistorbased ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.

Document History

IEEE 1620.1
June 8, 2006
Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions...
June 8, 2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions...

References

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